Home
Measure
Products
Technical
News
Service
About Us
Join Us
Contact Us
Microscopic Optical 3D Metrology
Scratch Depth Measurement
Blind Hole Depth Measurement
Micro-nano Pattern Structure Measurement
Surface Roughness
Flatness & Planarity Measurement
Surface Figure Accuracy - PV - RMS Parameters
Micro-nano Pattern Coplanarity
Multi-layer Film Thickness Analysis
Freeform Surface - Profile Tolerance Comparison
Macro Optical 3D Measurement
Multi-surface Parallelism Measurement
Geometric Tolerance Measurement
Angle and Radius R Measurement
Plane Step Height
Flatness & Planarity Measurement
Wafer TTV Bow Warp Measurement
Deep Hole 3D Profile Measurement
Non-transparent Top-Bottom Thickness Uniformity
Curved Surface R Measurement
Micro Optical Dynamic Vibration Testing
MEMS Pressure Sensing
MENS
MEMS Comb Drive
MEMS Comb Drive
TTV Thickness Uniformity
3D Laser Doppler Vibrometry
MEMS Cantilever
MEMS Microphone
Macro Optical Dynamic Vibration Testing
Ultrasonic Welding Experimental Modal Testing
Aero Turbine Blade 3D Dynamic Vibration Test
Vehicle NVH Analysis
UAV Wing Vibration
Flowmeter
Speed Sensor
Speaker 3D Vibration Analysis
Dynamic 3D Vibration Testing
Optical 3D Testing Service
White‑Light Interferometry Imaging System
Laser Coherent Imaging System
Triangulation‑based Optical 3D Profiler
Wafer Thickness Measurement System
Micro‑Dynamic Vibration Measuring System
Micro-nano Pattern Foundry Service
Micro‑Nano Optics
6‑inch PIC
Advanced Packaging
Device Fabrication
Wafer Inventory
Micro-nano Laser Processing Service
Laser Drilling
Laser Cleaving
Laser Trimming
Laser Beam Shaping Module
Rectangular Spot
Circular Spot
Line Spot
Optical Profilometry
Micro-Nano Process Foundry
Micro-Nano Laser Processing
Laser Beam Shaping
Company News
Exhibition Activities
News
Testing Service
Foundry Service
Instrument Repair
|
EN
400-6181-608
Chinese
Ultra-thin Wafer
Learn More
Conductive and Semi-Insulating SiC Wafer
Learn More
Composite Substrate
Learn More
Various Silicon Wafers & Test Wafers
Learn More
LN LT BaF₂
Learn More
Advanced Materials
Learn More
Location:
Home
Products
Micro-nano Pattern Foundry Service
Wafer Inventory
Wafer Inventory
公司新闻
Thin & Thick Film Thermal Oxide Wafer
Download
Expand
Fold up
6寸 高阻热氧片 电阻率1 Ω·m
6寸 专用热氧片 热氧层厚度4.7um
8寸 高阻热氧片 电阻率1 Ω·m
8寸 专用热氧片 热氧层厚度4.7um
常规厚膜热氧片 热氧层厚度：500nm、1um、2um、3um
定制热氧片服务 6 8英寸设备，一炉100片，高效低成本
公司新闻
Glass Wafer & High Refractive Index Glass Wafer
Download
Expand
Fold up
玻璃晶圆及高折率玻璃晶圆(05251801158)(05251801208)(05251801269)
玻璃晶圆及高折率玻璃晶圆
玻璃晶圆及高折率玻璃晶圆(05251801158)
玻璃晶圆及高折率玻璃晶圆(05251801207)
玻璃晶圆及高折率玻璃晶圆(05251801158)(05251801208)
玻璃晶圆及高折率玻璃晶圆(05251801207)(05251801269)
公司新闻
Ultra-thin Wafer
Download
Expand
Fold up
Ultra-thin Wafer
Conductive and Semi-Insulating SiC Wafer
LN LT BaF₂
Composite Substrate
Advanced Materials
公司新闻
Conductive and Semi-Insulating SiC Wafer
Download
Expand
Fold up
No Data
公司新闻
Composite Substrate
Download
Expand
Fold up
No Data
公司新闻
Various Silicon Wafers & Test Wafers
Download
Expand
Fold up
No Data
公司新闻
LN LT BaF₂
Download
Expand
Fold up
No Data
公司新闻
Advanced Materials
Download
Expand
Fold up
No Data
Home
Prev
1
Next
Last
Technical Concept
Optical Profilometry
Strictly control inkjet process precisio...
High-precision detection of laser scribi...
Establish a high-end display inkjet qual...
Optimize the optical color rendering per...
More
Micro-Nano Process Foundry
Leverage optical 3D profilometers to con...
More
Micro-Nano Laser Processing
Introduction to Grating and Metastructur...
More
Laser Beam Shaping
Strictly control pixel forming precision...
Correlation between Poor Surface Flatnes...
Correlation between Poor Flatness of the...
More
WeChat Consultation
Phone Consultation
Tel：
400-6181-608
WeChat
Phone
WeChat Consultation
Click on the phone to make a call
Tel：
400-6181-608